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Issue No.01 - January/February (1989 vol.6)
pp: 36-44
ABSTRACT
<p>The authors propose a way to merge boundary scan with the built-in self-test (BIST) of printed circuit boards. Their boundary-scan structure is based on Version 2.0 of the Joint Task Action Group's recommendations for boundary scan and incorporates BIST using a register based on cellular automata (CA) techniques. They examine test patterns generated from this register and the more conventional linear-feedback shift register. The advantages of the CA register, or CAR, are its modularity, which allows modification without major redesign, its higher stuck-at fault coverage, and its higher transition fault coverage.</p>
CITATION
Clay S. Gloster Jr., Franc Brglez, "Boundary Scan with Built-In Self-Test", IEEE Design & Test of Computers, vol.6, no. 1, pp. 36-44, January/February 1989, doi:10.1109/54.20388
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