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Issue No.01 - January/February (1989 vol.6)
pp: 26-34
ABSTRACT
<p>The authors present the specification and design of a self-test mechanism for static random-access memories (RAMs). The test algorithm provides excellent fault detection, and its structure is independent of address and data scrambling. The self-test machine generates data backgrounds on chip and is therefore suitable for both bit-oriented and word-oriented SRAMs. It is also suitable for both embedded SRAMs and stand-alone SRAMs, and adapts to boundary-scan environment. Because of the regular and symmetric structure of the test algorithm, the silicon overhead is only 3% for a 16 K synchronous SRAM.</p>
CITATION
Rob Dekker, Frans Beenker, Loek Thijssen, "Realistic Built-In Self-Test for Static RAMs", IEEE Design & Test of Computers, vol.6, no. 1, pp. 26-34, January/February 1989, doi:10.1109/54.20387
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