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Test Research in Japan
September/October 1988 (vol. 5 no. 5)
pp. 60-79

Surveys recent research activities in test technology for computers, focusing on the results of university researchers. They cover test-pattern generation, fault simulation, design for testability, built-in self-test, and self-checking.

Citation:
Hideo Fujiwara, Yuzo Takamatsu, Takashi Nanya, Teruhiko Yamada, Hideo Tamamoto, Kiyoshi Furuya, "Test Research in Japan," IEEE Design & Test of Computers, vol. 5, no. 5, pp. 60-79, Sept.-Oct. 1988, doi:10.1109/54.7982
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