Searching...
Advanced Search
Design&Test
1988
Issue No. 4 - July/August
This Publication
Digital Library
Advanced Search
This Publication
Subscribe to this Publication
Login to access your subscribed content
RSS feed for this Publication
Bibliographic References
ASCII Text
BibTex
RefWorks Procite/RefMan/EndNote
IEEE Design & Test of Computers
July/August 1988 (vol. 5 no. 4)
ISSN: 0740-7475
Table of Contents
EIC Message
EIC Message
(Abstract)
pp. 1
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
D&T News
DAC 88 and new silicon computer
(Abstract)
pp. 2, 37
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
Articles
The 1988 International Test Conference: New Frontiers in Testing
(Abstract)
pp. 3-13
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
Analysis of Testable PLA Designs
(Abstract)
Xi-An Zhu
Melvin A. Breuer
pp. 14-28
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Built-In Test for RAMs
(Abstract)
Paul H. Bardell Jr.
William H. McAnney
pp. 29-36
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Built-In Self-Test of a CMOS ALU
(Abstract)
E. Cerny
E. Aboulhamid
G. Bois
J. Cloutier
pp. 38-48
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
A D&T Roundtable: CAD Software Development
(Abstract)
pp. 49-58
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
In Brief
Product enhancements/industry activities
(Abstract)
pp. 59-60
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
Peer Review Notice
|
Give Us Feedback
Usage of this product signifies your acceptance of the
Terms of Use
.
Open
Download
Print and Online Advertising Opportunities
