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Built-In Self-Test of a CMOS ALU
July/August 1988 (vol. 5 no. 4)
pp. 38-48

A technique is proposed for implementing BIST (built-in self-test) in a CMOS arithmetic and logic unit (ALU). The approach covers single stuck-open faults and all functional faults that do not induce memory effects. The specific fault set covered by the test includes: (1) all single stuck-open faults on n and p transistors anywhere in the ALU (F1 faults); and (2) all functional faults that affect any single-bit slice of the (F2 faults), a functional fault being any fault that changes one combinational function into another. Functional faults in multiple slices are also detectable, as long as they do not generate identical responses in all even-numbered or odd-numbered ALU slices. With common techniques for test vector generation and response-verification, this BIST implementation provides higher fault coverage with only a small increase in surface area.

Citation:
E. Cerny, E. Aboulhamid, G. Bois, J. Cloutier, "Built-In Self-Test of a CMOS ALU," IEEE Design & Test of Computers, vol. 5, no. 4, pp. 38-48, July-Aug. 1988, doi:10.1109/54.7968
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