|
| This Article | ||
| ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
 Digg  Furl  Spurl  Blink  Simpy  Google  Del.icio.us  Y!MyWeb | ||
| Search | ||
The 1988 International Test Conference: New Frontiers in Testing
July/August 1988 (vol. 5 no. 4)
pp. 3-13
| ASCII Text | x | ||
| "The 1988 International Test Conference: New Frontiers in Testing," IEEE Design & Test of Computers, vol. 5, no. 4, pp. 3-13, July/August, 1988. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1988.10020, author = {}, title = {The 1988 International Test Conference: New Frontiers in Testing}, journal ={IEEE Design & Test of Computers}, volume = {5}, number = {4}, issn = {0740-7475}, year = {1988}, pages = {3-13}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1988.10020}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - The 1988 International Test Conference: New Frontiers in Testing IS - 4 SN - 0740-7475 SP3 EP13 EPD - 3-13 PY - 1988 VL - 5 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"The 1988 International Test Conference: New Frontiers in Testing," IEEE Design & Test of Computers, vol. 5, no. 4, pp. 3-13, July-Aug. 1988, doi:10.1109/MDT.1988.10020
Usage of this product signifies your acceptance of the Terms of Use.