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Design&Test
1988
Issue No. 3 - May/June
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Bibliographic References
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IEEE Design & Test of Computers
May/June 1988 (vol. 5 no. 3)
ISSN: 0740-7475
Table of Contents
EIC Message
EIC Message
(Abstract)
pp. 2
ABSTRACT
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D&T News
GE Superconductivity experiments
(Abstract)
pp. 3-4
ABSTRACT
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In Brief
Abstracts of industrial activities
(Abstract)
pp. 4, 10
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Articles
The Design Automation Conference: 25 Years of Excellence
(Abstract)
pp. 6-9
ABSTRACT
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Design Verification of the WE 32106 Math Accelerator Unit
(Abstract)
Peter M. Maurer
pp. 11-21
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Behavioral Model Synthesis with Cones
(Abstract)
Charles E. Stroud
Ronald R. Munoz
David A. Pierce
pp. 22-30
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Behavioral-Level Fault Simulation
(Abstract)
Sumit Ghosh
pp. 31-42
ABSTRACT
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Algorithms for Automatic Test-Pattern Generation
(Abstract)
Tom Kirkland
M. Ray Mercer
pp. 43-55
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Throughput Advantages of Asynchronous Prober Control
(Abstract)
Robert J. Powers
pp. 56-63
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Design Automation TC Newsletter
Design Automation TC Newsletter
(Abstract)
pp. 71
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