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Throughput Advantages of Asynchronous Prober Control
May/June 1988 (vol. 5 no. 3)
pp. 56-63

Parallel testing of memories at the wafer-sort stage can offer significant throughput advantages. Accepted methods at this state involve synchronous prober control. A model is presented that shows how asynchronous prober control can increase throughput 36% over that possible with synchronous control.

Citation:
Robert J. Powers, "Throughput Advantages of Asynchronous Prober Control," IEEE Design & Test of Computers, vol. 5, no. 3, pp. 56-63, May-June 1988, doi:10.1109/54.7963
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