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Issue No.03 - May/June (1988 vol.5)
pp: 43-55
ABSTRACT
<p>Three well-known algorithms for the automatic test pattern generation (ATPG) for digital circuits are the D algorithm, Podem, and Fan. The author introduces the concept of test generation and analyzes the way each algorithm uses search and backtracking techniques to sensitize a fault and propagate it to an observable point. The heuristics used to guide ATPG search and the notation used to represent circuit values are examined.</p>
CITATION
Tom Kirkland, M. Ray Mercer, "Algorithms for Automatic Test-Pattern Generation", IEEE Design & Test of Computers, vol.5, no. 3, pp. 43-55, May/June 1988, doi:10.1109/54.7962
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