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Algorithms for Automatic Test-Pattern Generation
May/June 1988 (vol. 5 no. 3)
pp. 43-55

Three well-known algorithms for the automatic test pattern generation (ATPG) for digital circuits are the D algorithm, Podem, and Fan. The author introduces the concept of test generation and analyzes the way each algorithm uses search and backtracking techniques to sensitize a fault and propagate it to an observable point. The heuristics used to guide ATPG search and the notation used to represent circuit values are examined.

Citation:
Tom Kirkland, M. Ray Mercer, "Algorithms for Automatic Test-Pattern Generation," IEEE Design & Test of Computers, vol. 5, no. 3, pp. 43-55, May-June 1988, doi:10.1109/54.7962
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