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Design&Test
1988
Issue No. 2 - March/April
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Bibliographic References
ASCII Text
BibTex
Refworks Procite/RefMan
IEEE Design & Test of Computers
March/April 1988 (vol. 5 no. 2)
ISSN: 0740-7475
Table of Contents
EIC Message
EIC Message
(Abstract)
pp. 2
ABSTRACT
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In Brief
Abstracts of industry activities
(Abstract)
pp. 4
ABSTRACT
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Standards
DASS call for participation
(Abstract)
pp. 5
ABSTRACT
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Articles
Integrating Design, Test, and Manufacturing
(Abstract)
Gordon Padwick
pp. 6-7
ABSTRACT
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Designing Circuits with Partial Scan
(Abstract)
Vishiwani D. Agrawal
Kwang-Ting Cheng
Daniel D. Johnson
Tony Sheng Lin
pp. 8-15
ABSTRACT
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Real-World Board Test Effectiveness
(Abstract)
Ed O. Schlotzhauer
pp. 16-23
ABSTRACT
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250-MHz Advanced Test Systems
(Abstract)
Algirdas J. Gruodis
Dale E. Hoffman
pp. 24-35
ABSTRACT
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A Workstation Approach to IC Process and Device Design
(Abstract)
Duane S. Boning
Dimitri A. Antoniadis
pp. 36-47
ABSTRACT
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D&T Roundtable: Test Fixtures-How Effective are They?
(Abstract)
pp. 48-57
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