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250-MHz Advanced Test Systems
March/April 1988 (vol. 5 no. 2)
pp. 24-35

New generations of electronic chips bring with them the promise of more capacity, storage, and speed. They also bring new challenges to design, test and manufacturing. A look at a series of advanced test systems, how they were designed and why, sheds new light on this practical side of advanced technology. These test systems are the ATS series from IBM.

Citation:
Algirdas J. Gruodis, Dale E. Hoffman, "250-MHz Advanced Test Systems," IEEE Design & Test of Computers, vol. 5, no. 2, pp. 24-35, March-April 1988, doi:10.1109/54.2034
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