The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.02 - March/April (1988 vol.5)
pp: 24-35
ABSTRACT
<p>New generations of electronic chips bring with them the promise of more capacity, storage, and speed. They also bring new challenges to design, test and manufacturing. A look at a series of advanced test systems, how they were designed and why, sheds new light on this practical side of advanced technology. These test systems are the ATS series from IBM.</p>
CITATION
Algirdas J. Gruodis, Dale E. Hoffman, "250-MHz Advanced Test Systems", IEEE Design & Test of Computers, vol.5, no. 2, pp. 24-35, March/April 1988, doi:10.1109/54.2034
32 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool