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Issue No.06 - November/December (1987 vol.4)
pp: 30-40
Janusz Rajski , McGill University
Vinod Agarwal , McGill University
ABSTRACT
The testing properties of inverter-free PLAs make them ideal for application to totally self-checking and easily testablecircuits. After a class of test patterns and masking relations for these new patterns are determined, a complete test setfor single and multiple crosspoint faults can be easily generated. Moreover, the procedure does not require any fault simulation.The code space inputs detect all single and multiple faults in PLAs for totally self-checking circuits, even if the faultsare not unidirectional. The test results can be used to analyze easily testable PLAs. With minor hardware changes in one-inputdecoder PLAs, the personality matrix will serve as a complete test set.
INDEX TERMS
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CITATION
Janusz Rajski, Vinod Agarwal, "Testing And Applications of Inverter-Free PLAs", IEEE Design & Test of Computers, vol.4, no. 6, pp. 30-40, November/December 1987, doi:10.1109/MDT.1987.295215
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