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Issue No.04 - July/August (1987 vol.4)
pp: 4-14
ABSTRACT
Provides a listing of upcoming conference events of interest to practitioners and researchers.
CITATION
"International Test Conference 1987", IEEE Design & Test of Computers, vol.4, no. 4, pp. 4-14, July/August 1987, doi:10.1109/MDT.1987.295142
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