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July/August 1987 (vol. 4 no. 4)
pp. 4-14
Provides a listing of upcoming conference events of interest to practitioners and researchers.
Citation:
"International Test Conference 1987," IEEE Design & Test of Computers, vol. 4, no. 4, pp. 4-14, July-Aug. 1987, doi:10.1109/MDT.1987.295142
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