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Design&Test
1987
Issue No. 3 - May/June
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Bibliographic References
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IEEE Design & Test of Computers
May/June 1987 (vol. 4 no. 3)
ISSN: 0740-7475
Table of Contents
Papers
IEEE Design&Test of Computers
(PDF)
pp. c1
ABSTRACT
PDF
'Real-Time' Solution to ASIC Verification
(PDF)
pp. c2
ABSTRACT
PDF
New for Network Designers
(PDF)
pp. 1
ABSTRACT
PDF
If You're Not Finding Gate Array, Advanced Schottky, And SMT Faults, Maybe the Fault Lies with Your Tester
(PDF)
pp. 2-3
ABSTRACT
PDF
Editor-In-Chief's Message
(PDF)
pp. 4
ABSTRACT
PDF
The Computer Society
(PDF)
pp. 5
ABSTRACT
PDF
Editorial Board
(PDF)
pp. 6
ABSTRACT
PDF
Editorial Board
(PDF)
pp. 7
ABSTRACT
PDF
D&T Scene
(PDF)
pp. 8-62
ABSTRACT
PDF
Industry Briefs
(PDF)
pp. 9
ABSTRACT
PDF
Physical Design of Microprocessors
(PDF)
pp. 10-11
ABSTRACT
PDF
1987 Design Automation Conference
(PDF)
pp. 12-20
ABSTRACT
PDF
Using CAD Tools in the Design of CRISP
(Abstract)
David Ditzel
, AT&T Bell Laboratories
Alan Berenbaum
, AT&T Information Systems
pp. 21-31
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Designing the Micro/370
(Abstract)
H.h. Chao
, IBM T. J. Watson Research Center
S. Ong
, IBM T. J. Watson Research Center
M. Tsai
, IBM T. J. Watson Research Center
F.w. Shih
, IBM T. J. Watson Research Center
K.W. Lewis
, IBM T. J. Watson Research Center
J. F. Tang
, IBM T. J. Watson Research Center
C. Trempel
, IBM T. J. Watson Research Center
H. Yu
, IBM T. J. Watson Research Center
P.E. McCormick
, IBM T. J. Watson Research Center
C. Davis
, IBM T. J. Watson Research Center
A. Diamond
, IBM T. J. Watson Research Center
T. Medve
, IBM T. J. Watson Research Center
J. L. Hou
, IBM T. J. Watson Research Center
pp. 32-40
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
For Design/Test Engineering Digital Has It Now
(PDF)
pp. 41
ABSTRACT
PDF
Design And Test of the 80386
(Abstract)
Patrick Gelsinger
, Intel Corp.
pp. 42-50
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
D&T Calendar
(PDF)
pp. 50
ABSTRACT
PDF
?ITC. The Only Serious Place for Test?
(PDF)
pp. 51
ABSTRACT
PDF
The Design of Dedicated 32-Bit Processors
(Abstract)
Shoji Horiguchi
, Nippon Telegraph and Telephone Corp.
Hiroshi Yoshimura
, Nippon Telegraph and Telephone Corp.
Mitsuyoshi Nagatani
, Nippon Telegraph and Telephone Corp.
Kennosuke Fukami
, Nippon Telegraph and Telephone Corp.
pp. 52-58
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
New Products Design
(PDF)
pp. 59-60
ABSTRACT
PDF
New Products Test
(PDF)
pp. 61-62
ABSTRACT
PDF
D&T Conferences
(PDF)
pp. 63-64
ABSTRACT
PDF
ACM/IEEE 24th Design Automation Conference?
(PDF)
pp. 65
ABSTRACT
PDF
Design Automation Technical Committee News Letter
(PDF)
pp. 66-67
ABSTRACT
PDF
IEEE International Conference on Computer Design: VLSI in Computers
(PDF)
pp. 68-69
ABSTRACT
PDF
Book Reviews
(PDF)
pp. 70-71
ABSTRACT
PDF
Call for Papers
(PDF)
pp. 71
ABSTRACT
PDF
Advertiser/Product Index
(PDF)
pp. 72
ABSTRACT
PDF
IEEE Design&Test of Computers
(PDF)
pp. 72-a-72-b
ABSTRACT
PDF
The Intel Influence
(PDF)
pp. 72-c
ABSTRACT
PDF
Our Simulations Are Accelerated on the MAGNUM. It's Fast, Low-Cost And It's a Zycad
(PDF)
pp. 72-d
ABSTRACT
PDF
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