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| ASCII Text | x | ||
| "D&T Conferences," IEEE Design & Test of Computers, vol. 4, no. 3, pp. 63-64, May/June, 1987. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1987.295192, author = {}, title = {D&T Conferences}, journal ={IEEE Design & Test of Computers}, volume = {4}, number = {3}, issn = {0740-7475}, year = {1987}, pages = {63-64}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1987.295192}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - D&T Conferences IS - 3 SN - 0740-7475 SP63 EP64 EPD - 63-64 PY - 1987 KW - null VL - 4 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"D&T Conferences," IEEE Design & Test of Computers, vol. 4, no. 3, pp. 63-64, May-June 1987, doi:10.1109/MDT.1987.295192
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