• Design&Test
  • 1987
  • Issue No. 2 - March/April
  • Abstract - Expert System Offers Artificially Intelligent Guidance to Built-In Self-Testing of CMOS Stuck-Open Faults in Hardware AcceleratorsBuilt with Systolic Arrays Produced by Silicon Compilers via Simulated Annealing
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Citation:
"Expert System Offers Artificially Intelligent Guidance to Built-In Self-Testing of CMOS Stuck-Open Faults in Hardware AcceleratorsBuilt with Systolic Arrays Produced by Silicon Compilers via Simulated Annealing," IEEE Design & Test of Computers, vol. 4, no. 2, pp. 6-7, March-April 1987, doi:10.1109/MDT.1987.295097
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