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IEEE Design & Test of Computers
January/February 1987 (vol. 4 no. 1)
ISSN: 0740-7475
Table of Contents
Papers
Randy Katz, University of California, Berkeley
Rajiv Bhateja, University of California, Berkeley
Ellis Chang, University of California, Berkeley
David Gedye, University of California, Berkeley
Vony Trijanto, University of California, Berkeley
pp. 12-22
Hiroyuki Watanabe, University of North Carolina Bryan Ackland, AT&T Bell Laboratories
pp. 32-41
Kewal Saluja, University of Wisconsin
Siew Sng, Reliability Singapore
Kozo Kinoshita, Hiroshima University
pp. 42-51
Sudhakar Reddy, University of Iowa
R. Dandapani, University of Colorado
pp. 52-54
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