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January/February 1987 (vol. 4 no. 1)
pp. 52-54
Sudhakar Reddy, University of Iowa
R. Dandapani, University of Colorado
Classical scan designs require properly augmented flip-flops, often called scan flip-flops. Problems stem from the high areaoverhead implied by the need for these flip-flops or the inability to modify standard flip-flops. The authors outline a methodto design easily testable sequential circuits that achieve scan designs using standard (unmodified) flip-flops.
Citation:
Sudhakar Reddy, R. Dandapani, "Scan Design Using Standard Flip-Flops," IEEE Design & Test of Computers, vol. 4, no. 1, pp. 52-54, Jan.-Feb. 1987, doi:10.1109/MDT.1987.295115
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