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| ASCII Text | x | ||
| "ATE Seminars," IEEE Design & Test of Computers, vol. 3, no. 6, pp. 50, November/December, 1986. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1986.295054, author = {}, title = {ATE Seminars}, journal ={IEEE Design & Test of Computers}, volume = {3}, number = {6}, issn = {0740-7475}, year = {1986}, pages = {50}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1986.295054}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - ATE Seminars IS - 6 SN - 0740-7475 SP EP EPD - 50 PY - 1986 KW - null VL - 3 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"ATE Seminars," IEEE Design & Test of Computers, vol. 3, no. 6, pp. 50, Nov.-Dec. 1986, doi:10.1109/MDT.1986.295054
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