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Self-Test in a Standard Cell Environment
November/December 1986 (vol. 3 no. 6)
pp. 35-41
J.P. Mucha, University of Hanover, FRG
W. Daehn, University of Hanover, FRG
J. Gross, University of Hanover, FRG
Citation:
J.P. Mucha, W. Daehn, J. Gross, "Self-Test in a Standard Cell Environment," IEEE Design & Test of Computers, vol. 3, no. 6, pp. 35-41, Nov.-Dec. 1986, doi:10.1109/MDT.1986.295051
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