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Macro Testing: Unifying IC And Board Test
November/December 1986 (vol. 3 no. 6)
pp. 26-32
F.P.M. Beenker, Philips Research Labs
K.j.e. Eerdewijk, Philips Research Labs
R.B.W. Gerritsen, Philips Telecommunications and Data Systems
F.N. Peacock, Philips Telecommunications and Data Systems
M. Der Star, Philips Telecommunications and Data Systems
Historically, IC testing and board testing have been considered two separate subjects. However, today's increasing complexityin both design and technology has given rise to a number of efforts to produce a consistent test strategy that smoothly couplesboth types of testing. This article describes one such effort by Philips, a design for testability methodology for semicustomVLSI circuits. The methodology is based on the partitioning of a design into testable macros, hence the term ?macro testing.?The challenges in this approach are the partitioning itself, the selection of a test technique suited to the separate macrosand the chip's architecture, the execution of a macro test independent of its environment, and the assembly of macro testsinto a chip test.
Citation:
F.P.M. Beenker, K.j.e. Eerdewijk, R.B.W. Gerritsen, F.N. Peacock, M. Der Star, "Macro Testing: Unifying IC And Board Test," IEEE Design & Test of Computers, vol. 3, no. 6, pp. 26-32, Nov.-Dec. 1986, doi:10.1109/MDT.1986.295048
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