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Detecting FET Stuck-Open Faults in CMOS Latches And Flip-Flops
September/October 1986 (vol. 3 no. 5)
pp. 17-26
Madhukar Reddy, University of Iowa
Sudhakar Reddy, University of Iowa
The authors present evidence that conventional tests cannot detect FET stuck-open faults in several CMOS latches and flip-flops.Examples are given to show that stuck-open faults can change static latches and flip-flops into dynamic devices?a danger tocircuits whose operation requires static memory, since undetected FET stuck-open faults can cause malfunctions. Designs aregiven for several memory devices in which all single FET stuck-open faults are detectable. These memory devices include commonlatches, master-slave flip-flops, and scan-path flip-flops that can be used in applications requiring static memory elementswhose operation can be reliably ascertained through conventional fault testing methods.
Madhukar Reddy, Sudhakar Reddy, "Detecting FET Stuck-Open Faults in CMOS Latches And Flip-Flops," IEEE Design & Test of Computers, vol. 3, no. 5, pp. 17-26, Sept.-Oct. 1986, doi:10.1109/MDT.1986.295040
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