Issue No.05 - September/October (1986 vol.3)
Madhukar Reddy , University of Iowa
The authors present evidence that conventional tests cannot detect FET stuck-open faults in several CMOS latches and flip-flops.Examples are given to show that stuck-open faults can change static latches and flip-flops into dynamic devices?a danger tocircuits whose operation requires static memory, since undetected FET stuck-open faults can cause malfunctions. Designs aregiven for several memory devices in which all single FET stuck-open faults are detectable. These memory devices include commonlatches, master-slave flip-flops, and scan-path flip-flops that can be used in applications requiring static memory elementswhose operation can be reliably ascertained through conventional fault testing methods.
Madhukar Reddy, "Detecting FET Stuck-Open Faults in CMOS Latches And Flip-Flops", IEEE Design & Test of Computers, vol.3, no. 5, pp. 17-26, September/October 1986, doi:10.1109/MDT.1986.295040