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Issue No.04 - July/August (1986 vol.3)
pp: 43-54
M. Abramovici , AT&T Information Systems
J.J. Kulikowski , AT&T Information Systems
P.R. Menon , AT&T Information Systems
D.T. Miller , AT&T Information Systems
ABSTRACT
This article describes new concepts and algorithms used to generate tests for VLSI scan-design circuits. The new algorithmsinclude: 1. a low-cost fault-independent algorithm (SMART), 2. a fault-oriented algorithm (FAST), and 3. an algorithm fordynamic test set compaction. The fault-oriented algorithm is guided by new controllability/observability cost functions whoseobjective is to minimize the amount of search done in test generation.
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CITATION
M. Abramovici, J.J. Kulikowski, P.R. Menon, D.T. Miller, "SMART And FAST: Test Generation for VLSI Scan-Design Circuits", IEEE Design & Test of Computers, vol.3, no. 4, pp. 43-54, July/August 1986, doi:10.1109/MDT.1986.294975
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