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| "International Test Conference," IEEE Design & Test of Computers, vol. 3, no. 4, pp. itc-14-itc-32, July/August, 1986. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1986.294973, author = {}, title = {International Test Conference}, journal ={IEEE Design & Test of Computers}, volume = {3}, number = {4}, issn = {0740-7475}, year = {1986}, pages = {itc-14-itc-32}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1986.294973}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - International Test Conference IS - 4 SN - 0740-7475 SPitc EP14-itc-32 EPD - itc-14-itc-32 PY - 1986 VL - 3 JA - IEEE Design & Test of Computers ER - | |||
Provides a listing of upcoming conference events of interest to practitioners and researchers.
Citation:
"International Test Conference," IEEE Design & Test of Computers, vol. 3, no. 4, pp. itc-14-itc-32, July-Aug. 1986, doi:10.1109/MDT.1986.294973
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