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July/August 1986 (vol. 3 no. 4)
pp. itc-14-itc-32
Provides a listing of upcoming conference events of interest to practitioners and researchers.
Citation:
"International Test Conference," IEEE Design & Test of Computers, vol. 3, no. 4, pp. itc-14-itc-32, July-Aug. 1986, doi:10.1109/MDT.1986.294973
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