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Issue No.04 - July/August (1986 vol.3)
pp: itc-14-itc-32
ABSTRACT
Provides a listing of upcoming conference events of interest to practitioners and researchers.
CITATION
"International Test Conference", IEEE Design & Test of Computers, vol.3, no. 4, pp. itc-14-itc-32, July/August 1986, doi:10.1109/MDT.1986.294973
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