This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
A New Parallel Test Approach for Large Memories
July/August 1986 (vol. 3 no. 4)
pp. 15-22
Thirumalai Sridhar, Texas Instruments
Memory test times?and thus test costs?are increasing rapidly as the size of the memories grows each year. Testability techniquestherefore must be developed to reduce the test time without compromising the test quality. This article presents an approachthat meets this goal using parallel signature analyzers (PSAs). PSAs can access more data cells in parallel than I/O pinscan, and the approach's parallelism reduces the test time. The proposed method is analyzed with respect to test time, testquality, and silicon area penalty.
Citation:
Thirumalai Sridhar, "A New Parallel Test Approach for Large Memories," IEEE Design & Test of Computers, vol. 3, no. 4, pp. 15-22, July-Aug. 1986, doi:10.1109/MDT.1986.294965
Usage of this product signifies your acceptance of the Terms of Use.