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May/June 1986 (vol. 3 no. 3)
pp. 68-69
Conard Zagwyn, International Test Conference, 295 Valley St., Pembroke, MA 02359
Citation:
Conard Zagwyn, "New Products Test," IEEE Design & Test of Computers, vol. 3, no. 3, pp. 68-69, May-June 1986, doi:10.1109/MDT.1986.294999
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