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Issue No.03 - May/June (1986 vol.3)
pp: 68-69
Conard Zagwyn , International Test Conference, 295 Valley St., Pembroke, MA 02359
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CITATION
Conard Zagwyn, "New Products Test", IEEE Design & Test of Computers, vol.3, no. 3, pp. 68-69, May/June 1986, doi:10.1109/MDT.1986.294999
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