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March/April 1986 (vol. 3 no. 2)
pp. 85
Conrad Zagwyn, International Test Conference, 295 Valley St., Pembroke, MA 02359
Citation:
Conrad Zagwyn, "New Products Test," IEEE Design & Test of Computers, vol. 3, no. 2, pp. 85, March-April 1986, doi:10.1109/MDT.1986.294922
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