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Issue No.01 - January/February (vol.3)
ISSN: 0740-7475
TABLE OF CONTENTS
Papers
Rostam Joobbani , Carnegie-Mellon University
Daniel Siewiorek , Carnegie-Mellon University
pp. 12-23
Walter Scott , University of California, Berkeley
John Ousterhout , University of California, Berkeley
pp. 24-34
The CMU-CAM System (Abstract)
Andrzej Strojwas , Carnegie-Mellon University
pp. 35-44
H.s. Fung , GTE Laboratories, Inc.
S. Hirschhorn , GTE Laboratories, Inc.
pp. 45-57
Anshul Kumar , Indian Institute of Technology, Delhi
Anjali Arya , Indian Institute of Technology, Delhi
V.V. Swaminathan , Indian Institute of Technology, Delhi
Amit Misra , Indian Institute of Technology, Delhi
pp. 58-65
Louis Scheffer , Valid Logic Systems, Inc.
Ronny Soetarman , Valid Logic Systems, Inc.
pp. 66-74
C. Rogers , Microelectronics Center of North Carolina
pp. 75-81
Conrad Zagwyn , International Test Conference, 295 Valley St., Pembroke, MA 02359
pp. 88-90
J. Nash , Raytheon Co., Missile Systems Div., Hartwell Rd., Bedford, MA 01730
pp. 91-92
Book Reviews (PDF)
Robert Anderson , GenRad Inc., PO Box 32183, Phoenix, AZ 85064
pp. 95
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