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IEEE Design & Test of Computers
January/February 1986 (vol. 3 no. 1)
ISSN: 0740-7475
Table of Contents
Papers
Rostam Joobbani, Carnegie-Mellon University
Daniel Siewiorek, Carnegie-Mellon University
pp. 12-23
Walter Scott, University of California, Berkeley
John Ousterhout, University of California, Berkeley
pp. 24-34
The CMU-CAM System (Abstract)
Andrzej Strojwas, Carnegie-Mellon University
pp. 35-44
Anshul Kumar, Indian Institute of Technology, Delhi
Anjali Arya, Indian Institute of Technology, Delhi
V.V. Swaminathan, Indian Institute of Technology, Delhi
Amit Misra, Indian Institute of Technology, Delhi
pp. 58-65
Conrad Zagwyn, International Test Conference, 295 Valley St., Pembroke, MA 02359
pp. 88-90
J. Nash, Raytheon Co., Missile Systems Div., Hartwell Rd., Bedford, MA 01730
pp. 91-92
Book Reviews (PDF)
Robert Anderson, GenRad Inc., PO Box 32183, Phoenix, AZ 85064
pp. 95
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