Searching...
Advanced Search
Design&Test
1985
Issue No. 6 - November/December
This Publication
Digital Library
Advanced Search
This Publication
Subscribe to this Publication
Login to access your subscribed content
RSS feed for this Publication
Bibliographic References
ASCII Text
BibTex
RefWorks Procite/RefMan/EndNote
IEEE Design & Test of Computers
November/December 1985 (vol. 2 no. 6)
ISSN: 0740-7475
Table of Contents
Papers
1984 Academic Forum for Test Technology October 19, 1984
(PDF)
pp. 76
ABSTRACT
PDF
A New Periodical from the IEEE Computer Society
(PDF)
pp. 62
ABSTRACT
PDF
IEEE Design&Test of Computers
(PDF)
pp. c1
ABSTRACT
PDF
Choose LASAR Logic Simulation And Win the Board Game
(PDF)
pp. nil1-1
ABSTRACT
PDF
IEEE Computer Society
(PDF)
pp. 2
ABSTRACT
PDF
Membership Application
(PDF)
pp. 3
ABSTRACT
PDF
IEEE Computer Society
(PDF)
pp. 4
ABSTRACT
PDF
Editorial Board
(PDF)
pp. 5
ABSTRACT
PDF
From the Editor-in-Chief
(PDF)
pp. 6
ABSTRACT
PDF
D&T Scene
(PDF)
pp. 7-10
ABSTRACT
PDF
The Path to Successful Production
(PDF)
pp. 11-12
ABSTRACT
PDF
Inductive Fault Analysis of MOS Integrated Circuits
(Abstract)
John Shen
, Carnegie-Mellon University
W. Maly
, Carnegie-Mellon University
F. Ferguson
, Carnegie-Mellon University
pp. 13-26
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
PROD: A VLSI Fault Diagnosis System
(Abstract)
Peter Odryna
, Carnegie-Mellon University
Andrzej Strojwas
, Carnegie-Mellon University
pp. 27-35
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Noise Problems in Testing VLSI Hardware
(Abstract)
Kofi Torku
, IBM Corporation
Dave Kiesling
, IBM Corporation
pp. 36-43
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
IEEE Design&Test of Computers
(PDF)
pp. 43
ABSTRACT
PDF
Autoprobing on the L200 Functional Tester
(Abstract)
Tim Moore
, Digital Equipment Corp.
Stephen Garner
, Digital Equipment Corp.
pp. 44-49
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
IEEE-488
(PDF)
pp. 49
ABSTRACT
PDF
Operational Life Testing of Electronic Components
(Abstract)
David Farnholtz
, AT&T Technology Systems
pp. 50-56
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Teradyne's J967 VLSI Test System: Getting VLSI to the Market on Time
(Abstract)
Wayne Ponik
, Teradyne, Inc.
pp. 57-62
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Gate-Level Simulation
(Abstract)
pp. 63-71
ABSTRACT
PDF
HTML
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
D&T Conferences
(PDF)
pp. 72-76
ABSTRACT
PDF
D&T Reviewers
(PDF)
pp. 77-78
ABSTRACT
PDF
Calendar
(PDF)
pp. 79-81
ABSTRACT
PDF
Call for Papers
(PDF)
pp. 81
ABSTRACT
PDF
IEEE Design&Test Computers
(PDF)
pp. 82-87
ABSTRACT
PDF
Advertiser Index?December 1985
(PDF)
pp. 88
ABSTRACT
PDF
IEEE Design&Test of Computers
(PDF)
pp. 88-a-88-b
ABSTRACT
PDF
Call for Papers
(PDF)
pp. 88-c
ABSTRACT
PDF
Finally, a Logic Simulator That Keeps up with the Times
(PDF)
pp. 88-d
ABSTRACT
PDF
Peer Review Notice
|
Give Us Feedback
Usage of this product signifies your acceptance of the
Terms of Use
.
Open
Download
Print and Online Advertising Opportunities
