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IEEE Design & Test of Computers
November/December 1985 (vol. 2 no. 6)
ISSN: 0740-7475
Table of Contents
Papers
John Shen, Carnegie-Mellon University
W. Maly, Carnegie-Mellon University
F. Ferguson, Carnegie-Mellon University
pp. 13-26
Peter Odryna, Carnegie-Mellon University
Andrzej Strojwas, Carnegie-Mellon University
pp. 27-35
Tim Moore, Digital Equipment Corp.
Stephen Garner, Digital Equipment Corp.
pp. 44-49
Calendar (PDF)
pp. 79-81
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