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| "D&T Conferences," IEEE Design & Test of Computers, vol. 2, no. 6, pp. 72-76, November/December, 1985. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1985.294803, author = {}, title = {D&T Conferences}, journal ={IEEE Design & Test of Computers}, volume = {2}, number = {6}, issn = {0740-7475}, year = {1985}, pages = {72-76}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1985.294803}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - D&T Conferences IS - 6 SN - 0740-7475 SP72 EP76 EPD - 72-76 PY - 1985 KW - null VL - 2 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"D&T Conferences," IEEE Design & Test of Computers, vol. 2, no. 6, pp. 72-76, Nov.-Dec. 1985, doi:10.1109/MDT.1985.294803
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