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Issue No.06 - November/December (1985 vol.2)
pp: 50-56
David Farnholtz , AT&T Technology Systems
ABSTRACT
The infant mortality rates for ICs and other components have been a major concern throughout the electronics industry. OperationalLife Testing was developed by AT&T to continuously monitor the early-life failure levels of various electonic componentproduct families at the manufacturing plant. Rapid failure-mode analysis of OLT defects and implementation of the indicatedprocess, testing, and design changes have in resuled in significant savings and enhanced component reliability. OLT couldalso be applied to incoming components by a system manufacturer.
INDEX TERMS
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CITATION
David Farnholtz, "Operational Life Testing of Electronic Components", IEEE Design & Test of Computers, vol.2, no. 6, pp. 50-56, November/December 1985, doi:10.1109/MDT.1985.294799
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