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Autoprobing on the L200 Functional Tester
November/December 1985 (vol. 2 no. 6)
pp. 44-49
Tim Moore, Digital Equipment Corp.
Stephen Garner, Digital Equipment Corp.
The X-Y autoprobing process was developed to eliminate the need to manually probe prototype modules, and to diagnose productionmodules. The goal of the X-Y autoprobing process is to increase the throughput of the L200 functional tester by decreasingthe average diagnostic time, through automatic control of the probe's movement and positioning. The X-Y autoprobing systemsinstalled have demonstrated that the amount of time to probe manually can be reduced by a factor of ten.
Citation:
Tim Moore, Stephen Garner, "Autoprobing on the L200 Functional Tester," IEEE Design & Test of Computers, vol. 2, no. 6, pp. 44-49, Nov.-Dec. 1985, doi:10.1109/MDT.1985.294797
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