Issue No.06 - November/December (1985 vol.2)
Tim Moore , Digital Equipment Corp.
Stephen Garner , Digital Equipment Corp.
The X-Y autoprobing process was developed to eliminate the need to manually probe prototype modules, and to diagnose productionmodules. The goal of the X-Y autoprobing process is to increase the throughput of the L200 functional tester by decreasingthe average diagnostic time, through automatic control of the probe's movement and positioning. The X-Y autoprobing systemsinstalled have demonstrated that the amount of time to probe manually can be reduced by a factor of ten.
Tim Moore, Stephen Garner, "Autoprobing on the L200 Functional Tester", IEEE Design & Test of Computers, vol.2, no. 6, pp. 44-49, November/December 1985, doi:10.1109/MDT.1985.294797