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Issue No.06 - November/December (1985 vol.2)
pp: 36-43
Kofi Torku , IBM Corporation
Dave Kiesling , IBM Corporation
ABSTRACT
Noise resulting from the switching of high-current, off-product drivers in VLSI circuits cause substantial problems duringmanufacturing test and may lead to zero yield. These problems, seldom addressed during product design, can be mitigated oreliminated either during the design phase or at mauufacturing test. In this article, we present some of our experiences withnoise during manufacturing test, and discuss several solutions to the problem. These remedies include such manufacturing testoptions as relaxing the test specification, or ?guardbanding? which requires both substantial study of the impact on qualityand continual tracking of the problem level; modifying the test program to eliminate the need for a guardband; or having thelogic designer create a new set of functional test patterns specifically designed to avoid simultaneously switching drivers.We also examine alternative design methods for use during both product and tester design.
INDEX TERMS
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CITATION
Kofi Torku, Dave Kiesling, "Noise Problems in Testing VLSI Hardware", IEEE Design & Test of Computers, vol.2, no. 6, pp. 36-43, November/December 1985, doi:10.1109/MDT.1985.294795
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