This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Noise Problems in Testing VLSI Hardware
November/December 1985 (vol. 2 no. 6)
pp. 36-43
Kofi Torku, IBM Corporation
Dave Kiesling, IBM Corporation
Noise resulting from the switching of high-current, off-product drivers in VLSI circuits cause substantial problems duringmanufacturing test and may lead to zero yield. These problems, seldom addressed during product design, can be mitigated oreliminated either during the design phase or at mauufacturing test. In this article, we present some of our experiences withnoise during manufacturing test, and discuss several solutions to the problem. These remedies include such manufacturing testoptions as relaxing the test specification, or ?guardbanding? which requires both substantial study of the impact on qualityand continual tracking of the problem level; modifying the test program to eliminate the need for a guardband; or having thelogic designer create a new set of functional test patterns specifically designed to avoid simultaneously switching drivers.We also examine alternative design methods for use during both product and tester design.
Citation:
Kofi Torku, Dave Kiesling, "Noise Problems in Testing VLSI Hardware," IEEE Design & Test of Computers, vol. 2, no. 6, pp. 36-43, Nov.-Dec. 1985, doi:10.1109/MDT.1985.294795
Usage of this product signifies your acceptance of the Terms of Use.