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Inductive Fault Analysis of MOS Integrated Circuits
November/December 1985 (vol. 2 no. 6)
pp. 13-26
John Shen, Carnegie-Mellon University
W. Maly, Carnegie-Mellon University
F. Ferguson, Carnegie-Mellon University
Inductive Fault Analysis (IFA) is a systematic Procedure to predict all the faults that are likely to occur in MOS integratedcircuit or subcircuit The three major steps of the IFA procedure are: (1) generation of Physical defects using statisticaldata from the fabrication process; (2) extraction of circuit-level faults caused by these defects; and (3) classificationof faults types and ranking of faults based on their likelihood of occurrence Hence, given the layout of an IC, a fault modeland a ranked fault list can be automatically generated which take into account the technology, layout, and process characteristics.The IFA procedure is illustrated by its applications to an example circuit. The results from this sample led to some veryinteresting observations regarding nonclassical faults.
John Shen, W. Maly, F. Ferguson, "Inductive Fault Analysis of MOS Integrated Circuits," IEEE Design & Test of Computers, vol. 2, no. 6, pp. 13-26, Nov.-Dec. 1985, doi:10.1109/MDT.1985.294793
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