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| "D&T Interview," IEEE Design & Test of Computers, vol. 2, no. 5, pp. 90-97, September/October, 1985. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1985.294823, author = {}, title = {D&T Interview}, journal ={IEEE Design & Test of Computers}, volume = {2}, number = {5}, issn = {0740-7475}, year = {1985}, pages = {90-97}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1985.294823}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - D&T Interview IS - 5 SN - 0740-7475 SP90 EP97 EPD - 90-97 PY - 1985 KW - null VL - 2 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"D&T Interview," IEEE Design & Test of Computers, vol. 2, no. 5, pp. 90-97, Sept.-Oct. 1985, doi:10.1109/MDT.1985.294823
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