This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Milestones of New-Generation ATE
September/October 1985 (vol. 2 no. 5)
pp. 83-89
Tohru Kazamaki, Takeda Riken Company, Ltd.
Work began in 1976 to produce an accurate, high-speed, multipin tester in the 100-MHz range. Takeda Riken shipped the firstsuch device, the 100 MHz, 384-pin, split I/O Advantest T3380, in early 1979. Although it offered speed and accuracy, the T3380series was expensive, and it was later determined that the 40-MHz range was more practical and cost-effective for generaluse. This article describes the T3340 and T3341 testers developed to meet those needs. The T3340 provides signal integrityand a highfidelity DUT-to-tester interface, accurate timing, and innovative architecture to meet modem VLSI circuit testingrequirements. Delivery of the T3341 began this year; this improved version has extended timing edges, advanced failure analysiscapability, and a standard algorithmic pattern generator for testing memory-embedded generic gate arrays.
Citation:
Tohru Kazamaki, "Milestones of New-Generation ATE," IEEE Design & Test of Computers, vol. 2, no. 5, pp. 83-89, Sept.-Oct. 1985, doi:10.1109/MDT.1985.294821
Usage of this product signifies your acceptance of the Terms of Use.