|
| This Article | ||
| ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
| | ||
| Search | ||
| ||
An Integrated Design Automation System for VLSI Circuits
September/October 1985 (vol. 2 no. 5)
pp. 17-26
| ASCII Text | x | ||
| O. Karatsu, T. Hoshino, M. Endo, H. Kitazawa, T. Adachi, K. Ueda, "An Integrated Design Automation System for VLSI Circuits," IEEE Design & Test of Computers, vol. 2, no. 5, pp. 17-26, September/October, 1985. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1985.294812, author = {O. Karatsu and T. Hoshino and M. Endo and H. Kitazawa and T. Adachi and K. Ueda}, title = {An Integrated Design Automation System for VLSI Circuits}, journal ={IEEE Design & Test of Computers}, volume = {2}, number = {5}, issn = {0740-7475}, year = {1985}, pages = {17-26}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1985.294812}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - An Integrated Design Automation System for VLSI Circuits IS - 5 SN - 0740-7475 SP17 EP26 EPD - 17-26 A1 - O. Karatsu, A1 - T. Hoshino, A1 - M. Endo, A1 - H. Kitazawa, A1 - T. Adachi, A1 - K. Ueda, PY - 1985 KW - null VL - 2 JA - IEEE Design & Test of Computers ER - | |||
Our Integrated Design Automation System consists of an integrated design database, automated design processors, verificationtools, and an interactive capture system. The automatic logic synthesis program, Angel, and the hierarchical layout systemChamp/Alpha, have been particularly important in reducing the total design effort. A unified design language, HSL-FX, hasbeen developed to broaden LSI design system coverage and to obtain better results from automatic logic synthesis. Using thissystem, a 10K-gate CPU has been designed in two man-months?from function-level description to layour pattern.
Citation:
O. Karatsu, T. Hoshino, M. Endo, H. Kitazawa, T. Adachi, K. Ueda, "An Integrated Design Automation System for VLSI Circuits," IEEE Design & Test of Computers, vol. 2, no. 5, pp. 17-26, Sept.-Oct. 1985, doi:10.1109/MDT.1985.294812
Usage of this product signifies your acceptance of the Terms of Use.

