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IEEE Design & Test of Computers
July/August 1985 (vol. 2 no. 4)
ISSN: 0740-7475
Table of Contents
D&T Scene (PDF)
pp. 12-19
Aart De Geus, General Electric Microelectronics Center
William Cohen, General Electric Microelectronics Center
pp. 22-32
T.J. Kowalski, AT&T Bell Laboratories
D.J. Geiger, AT&T Bell Laboratories
W.H. Wolf, AT&T Bell Laboratories
W. Fichtner, AT&T Bell Laboratories
pp. 33-43
Magdy Abadir, University of Southern California
Melvin Breuer, University of Southern California
pp. 56-68
Tariq Samad, Carnegie-Mellon University
Stephen Director, Carnegie-Mellon University
pp. 78-86
J. Nash, Raytheon Co./Missile Systems Div./Hartwell Rd./Bedford, MA 01730
pp. 93-96
Conrad Zagwyn, LTX Corp., LTX Park at University, Westwood, MA 01090
pp. 97-99
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