|
| This Article | ||
| | ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
| | ||
| Search | ||
| ASCII Text | x | ||
| "Designing VISI Tests Is a Waste of Time," IEEE Design & Test of Computers, vol. 2, no. 4, pp. 11, July/August, 1985. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1985.294713, author = {}, title = {Designing VISI Tests Is a Waste of Time}, journal ={IEEE Design & Test of Computers}, volume = {2}, number = {4}, issn = {0740-7475}, year = {1985}, pages = {11}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1985.294713}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Designing VISI Tests Is a Waste of Time IS - 4 SN - 0740-7475 SP EP EPD - 11 PY - 1985 KW - null VL - 2 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"Designing VISI Tests Is a Waste of Time," IEEE Design & Test of Computers, vol. 2, no. 4, pp. 11, July-Aug. 1985, doi:10.1109/MDT.1985.294713
Usage of this product signifies your acceptance of the Terms of Use.

