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| "Selected Reprints on Logic Design for Testability 1984," IEEE Design & Test of Computers, vol. 2, no. 3, pp. 110-a, May/June, 1985. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1985.294775, author = {}, title = {Selected Reprints on Logic Design for Testability 1984}, journal ={IEEE Design & Test of Computers}, volume = {2}, number = {3}, issn = {0740-7475}, year = {1985}, pages = {110-a}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1985.294775}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Selected Reprints on Logic Design for Testability 1984 IS - 3 SN - 0740-7475 SP110 EPa EPD - 110-a PY - 1985 KW - null VL - 2 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"Selected Reprints on Logic Design for Testability 1984," IEEE Design & Test of Computers, vol. 2, no. 3, pp. 110-a, May-June 1985, doi:10.1109/MDT.1985.294775
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