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Issue No.03 - May/June (1985 vol.2)
pp: 86
ABSTRACT
Provides notice of upcoming conference events of interest to practitioners and researchers.
CITATION
"1984 Academic Forum for Test Technology October 19, 1984", IEEE Design & Test of Computers, vol.2, no. 3, pp. 86, May/June 1985, doi:10.1109/MDT.1985.294745
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