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| "1984 Academic Forum for Test Technology October 19, 1984," IEEE Design & Test of Computers, vol. 2, no. 3, pp. 86, May/June, 1985. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1985.294745, author = {}, title = {1984 Academic Forum for Test Technology October 19, 1984}, journal ={IEEE Design & Test of Computers}, volume = {2}, number = {3}, issn = {0740-7475}, year = {1985}, pages = {86}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1985.294745}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - 1984 Academic Forum for Test Technology October 19, 1984 IS - 3 SN - 0740-7475 SP EP EPD - 86 PY - 1985 VL - 2 JA - IEEE Design & Test of Computers ER - | |||
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Citation:
"1984 Academic Forum for Test Technology October 19, 1984," IEEE Design & Test of Computers, vol. 2, no. 3, pp. 86, May-June 1985, doi:10.1109/MDT.1985.294745
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