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A Fault-Driven, Comprehensive Redundancy Algorithm
May/June 1985 (vol. 2 no. 3)
pp. 35-44
| ASCII Text | x | ||
| John Day, "A Fault-Driven, Comprehensive Redundancy Algorithm," IEEE Design & Test of Computers, vol. 2, no. 3, pp. 35-44, May/June, 1985. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1985.294737, author = {John Day}, title = {A Fault-Driven, Comprehensive Redundancy Algorithm}, journal ={IEEE Design & Test of Computers}, volume = {2}, number = {3}, issn = {0740-7475}, year = {1985}, pages = {35-44}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1985.294737}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - A Fault-Driven, Comprehensive Redundancy Algorithm IS - 3 SN - 0740-7475 SP35 EP44 EPD - 35-44 A1 - John Day, PY - 1985 KW - null VL - 2 JA - IEEE Design & Test of Computers ER - | |||
This article describes a fault-driven algorithm that generates all possible repair solutions for a given bit failure patternin a redundant RAM. Benefits of this approach include the ability to select repair solutions based on userdefined preferences(for example, fewest total elements invoked or fewest rows invoked). Perhaps the greatest advantage of this algorithm is itsability to generate solutions for any theoretically repairable die that would be deemed unrepairable by existing algorithms.
Citation:
John Day, "A Fault-Driven, Comprehensive Redundancy Algorithm," IEEE Design & Test of Computers, vol. 2, no. 3, pp. 35-44, May-June 1985, doi:10.1109/MDT.1985.294737
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