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Issue No.03 - May/June (1985 vol.2)
pp: 35-44
John Day , Teradyne, Inc.
ABSTRACT
This article describes a fault-driven algorithm that generates all possible repair solutions for a given bit failure patternin a redundant RAM. Benefits of this approach include the ability to select repair solutions based on userdefined preferences(for example, fewest total elements invoked or fewest rows invoked). Perhaps the greatest advantage of this algorithm is itsability to generate solutions for any theoretically repairable die that would be deemed unrepairable by existing algorithms.
INDEX TERMS
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CITATION
John Day, "A Fault-Driven, Comprehensive Redundancy Algorithm", IEEE Design & Test of Computers, vol.2, no. 3, pp. 35-44, May/June 1985, doi:10.1109/MDT.1985.294737
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