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Issue No.03 - May/June (1985 vol.2)
pp: 29-34
Anthony Van Den Heuvel , Motorola, Inc.
Noshir Khory , Motorola, Inc.
ABSTRACT
This simple, useful, and practical approach to assess the cost benefits from using burned-in plastic ICs assumes a simpleapproximation for early life failure during burn-in and predicts the failure rate of the residual parts on the basis of yieldpercentage. Because product applications, end-user environment, and device quality vary, the simplicity of this method isobtained at the cost of some rigor. Nonetheless, the results are useful and are consistent with measured data.
INDEX TERMS
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CITATION
Anthony Van Den Heuvel, Noshir Khory, "A Basis for Setting Burn-in Yield Criteria", IEEE Design & Test of Computers, vol.2, no. 3, pp. 29-34, May/June 1985, doi:10.1109/MDT.1985.294735
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