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A Basis for Setting Burn-in Yield Criteria
May/June 1985 (vol. 2 no. 3)
pp. 29-34
Anthony Van Den Heuvel, Motorola, Inc.
Noshir Khory, Motorola, Inc.
This simple, useful, and practical approach to assess the cost benefits from using burned-in plastic ICs assumes a simpleapproximation for early life failure during burn-in and predicts the failure rate of the residual parts on the basis of yieldpercentage. Because product applications, end-user environment, and device quality vary, the simplicity of this method isobtained at the cost of some rigor. Nonetheless, the results are useful and are consistent with measured data.
Citation:
Anthony Van Den Heuvel, Noshir Khory, "A Basis for Setting Burn-in Yield Criteria," IEEE Design & Test of Computers, vol. 2, no. 3, pp. 29-34, May-June 1985, doi:10.1109/MDT.1985.294735
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