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"100% VLSI Fault Grading Is No Longer an Imaginary Goal. It's a Reality," IEEE Design & Test of Computers, vol. 2, no. 3, pp. 7, May/June, 1985.
 
 
BibTex
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@article{ 10.1109/MDT.1985.294728,
author = {},
title = {100% VLSI Fault Grading Is No Longer an Imaginary Goal. It's a Reality},
journal ={IEEE Design & Test of Computers},
volume = {2},
number = {3},
issn = {0740-7475},
year = {1985},
pages = {7},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1985.294728},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - 100% VLSI Fault Grading Is No Longer an Imaginary Goal. It's a Reality
IS - 3
SN - 0740-7475
SP
EP
EPD - 7
PY - 1985
KW - null
VL - 2
JA - IEEE Design & Test of Computers
ER -
 
Citation:
"100% VLSI Fault Grading Is No Longer an Imaginary Goal. It's a Reality," IEEE Design & Test of Computers, vol. 2, no. 3, pp. 7, May-June 1985, doi:10.1109/MDT.1985.294728
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