CSDL - IEEE Design and Test of Computers

1984 Academic Forum for Test Technology October 19, 1984 (PDF)

pp. 87

1984 IEEE Workshop on Languages for Automation November 1-3,1984 (PDF)

pp. 85

IEEE Design&Test of Computers (PDF)

pp. c1

The Challenge: To Create Multilevel Behavioral Simulation. The Answer: HELIX (PDF)

pp. c2

Is LASAR Logic Simulation Best? Take This Test (PDF)

pp. 2-3

IEEE Computer Society (PDF)

pp. 4

Editorial Board (PDF)

pp. 5

Expert for PCB Design (PDF)

pp. 6-7

D&T Guest Editorial (PDF)

pp. 8-10

D&T Scene (PDF)

pp. 10-16

Proceedings: 1983 International Test Conference, October 1983 (PDF)

pp. 15

Moving? (PDF)

pp. 16

Built-In Self-Test: Pass or Fail? (PDF)

pp. 17-19

The Challenge of the next Generation... (PDF)

pp. 20

Built-In Self-Test Techniques (Abstract)

Edward McCluskey, Stanford University

pp. 21-28

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Built-In Self-Test Structures (Abstract)

Edward McCluskey, Stanford University

pp. 29-36

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Back Issues (PDF)

pp. 36

Implementing a Built-In Self-Test PLA Design (Abstract)

Robert Treuer, McGill University

Hideo Fujiwara, McGill University

Vinod Agarwal, McGill University

pp. 37-48

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Advance Registration (PDF)

pp. 49

Self-Tested Data Flow Logic: A New Approach (Abstract)

Richard Illman, International Computers Limited

pp. 50-58

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Proceedings: 1984 International Conference on Computer Design, October 1984 (PDF)

pp. 58

Test Length in a Self-Testing Environment (Abstract)

Thomas Williams, IBM

pp. 59-63

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IEEE Design&Test of Computers (PDF)

pp. 63

Built-In Self-Test Trends in Motorola Microprocessors (Abstract)

R. Daniels, Motorola, Inc.

William Bruce, Motorola, Inc.

pp. 64-71

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Advertisement (PDF)

pp. 72

100% VLSI Fault Grading Is No Longer an Imaginary Goal. It's a Reality (PDF)

pp. 73

IEEE Computer Society Membership Application (PDF)

pp. 74

Fred Terman, the Father of Silicon Valley (Abstract)

Carolyn Tajnai, Stanford University

pp. 75-81

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Implementing And Managing a CAD System Based on Vendor-Supplied Tools (Abstract)

Donald Lacy, Western Digital Corporation

Lawrence Drenan, Hughes Aircraft Corporation

pp. 82-87

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Fault Modeling (Abstract)

pp. 88-95

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New Products Test (PDF)

Conrad Zagwyn, LTX Corp., LTX Park at University, Westwood, MA 01090.

pp. 96-100

New Products Design (PDF)

J. Nash, Raytheon Co., Missile Systems Div., Hartwell Rd., Bedford, MA 01730.

pp. 101-103

D&T Conferences (PDF)

pp. 104-105

Design Aids for VLSI: A Perspective Revisited (Abstract)

A. Newton, University of California, Berkeley

D. Pederson, University of California, Berkeley

A. Sangiovanni-vincentelli, University of California, Berkeley

pp. 106-115

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Calendar (PDF)

pp. 116

D&T Education (PDF)

pp. 117

Book Reviews (PDF)

Robert Anderson, GenRad Inc., PO Box 32183, Phoenix, AZ 85064.

pp. 118-119

D&T Standards (PDF)

pp. 119

Advertiser Index?April 1985 (PDF)

pp. 120

IEEE Design&Test of Computers (PDF)

pp. 120-a-120-b

Call for Papers (PDF)

pp. 120-c

Testing a New Automobile Has Always Meant Passing the Competition (PDF)

pp. 120-d