|
| This Article | ||
| | ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
 Digg  Furl  Spurl  Blink  Simpy  Google  Del.icio.us  Y!MyWeb | ||
| Search | ||
March/April 1985 (vol. 2 no. 2)
pp. 87
| ASCII Text | x | ||
| "1984 Academic Forum for Test Technology October 19, 1984," IEEE Design & Test of Computers, vol. 2, no. 2, pp. 87, March/April, 1985. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1985.294872, author = {}, title = {1984 Academic Forum for Test Technology October 19, 1984}, journal ={IEEE Design & Test of Computers}, volume = {2}, number = {2}, issn = {0740-7475}, year = {1985}, pages = {87}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1985.294872}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - 1984 Academic Forum for Test Technology October 19, 1984 IS - 2 SN - 0740-7475 SP EP EPD - 87 PY - 1985 VL - 2 JA - IEEE Design & Test of Computers ER - | |||
Provides notice of upcoming conference events of interest to practitioners and researchers.
Citation:
"1984 Academic Forum for Test Technology October 19, 1984," IEEE Design & Test of Computers, vol. 2, no. 2, pp. 87, March-April 1985, doi:10.1109/MDT.1985.294872
Usage of this product signifies your acceptance of the Terms of Use.