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Test Length in a Self-Testing Environment
March/April 1985 (vol. 2 no. 2)
pp. 59-63
| ASCII Text | x | ||
| Thomas Williams, "Test Length in a Self-Testing Environment," IEEE Design & Test of Computers, vol. 2, no. 2, pp. 59-63, March/April, 1985. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.1985.294863, author = {Thomas Williams}, title = {Test Length in a Self-Testing Environment}, journal ={IEEE Design & Test of Computers}, volume = {2}, number = {2}, issn = {0740-7475}, year = {1985}, pages = {59-63}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.1985.294863}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Test Length in a Self-Testing Environment IS - 2 SN - 0740-7475 SP59 EP63 EPD - 59-63 A1 - Thomas Williams, PY - 1985 KW - null VL - 2 JA - IEEE Design & Test of Computers ER - | |||
Two ideas are Coupled to help determine the Pseudorandom test length in a self-testing environment. The first is that yield,defect level after test, and test coverage are related. Tbe second is that Fault Coverage as ta function of the number ofpseudorandom test patterns can be approximated on semilogarithmic paper an exponential curve, with statistical confidenceintervals. Merging these two concepts allows one to relate the shipped defect level as a function of the number of radomppattterns and yield, With this knowledge, the test length of pseudorandom patterns Can be Predicted in a self-test environment.
Citation:
Thomas Williams, "Test Length in a Self-Testing Environment," IEEE Design & Test of Computers, vol. 2, no. 2, pp. 59-63, March-April 1985, doi:10.1109/MDT.1985.294863
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