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Built-In Self-Test Techniques
March/April 1985 (vol. 2 no. 2)
pp. 21-28
Edward McCluskey, Stanford University
A system that includes self-test features must have facilities for generating test patterns and analyzing the resultant circuitresponse. This article surveys the structures that are used to implement these self-test functions. The various techniquesused to convert the system bistables into test scan paths are discussed. The addition of bistables associated with the I/Obonding pads so that the pads can be accessed via a scan path (external or boundary scan path) is described. Most designsuse linear-feedback shift registers for both test pattern generation and response analysis. The various linear-feedback shiftregister designs for pseudorandom or pseudoexhaustive input test pattern generation and for output response signature analysisare presented.
Citation:
Edward McCluskey, "Built-In Self-Test Techniques," IEEE Design & Test of Computers, vol. 2, no. 2, pp. 21-28, March-April 1985, doi:10.1109/MDT.1985.294856
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