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| Daniel Hook, Diane Kelly, "Mutation Sensitivity Testing," Computing in Science and Engineering, vol. 11, no. 6, pp. 40-47, November/December, 2009. | |||
| BibTex | x | ||
| @article{ 10.1109/MCSE.2009.200, author = {Daniel Hook and Diane Kelly}, title = {Mutation Sensitivity Testing}, journal ={Computing in Science and Engineering}, volume = {11}, number = {6}, issn = {0740-7475}, year = {2009}, pages = {40-47}, doi = {http://doi.ieeecomputersociety.org/10.1109/MCSE.2009.200}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - Computing in Science and Engineering TI - Mutation Sensitivity Testing IS - 6 SN - 0740-7475 SP40 EP47 EPD - 40-47 A1 - Daniel Hook, A1 - Diane Kelly, PY - 2009 KW - Mutation Sensitivity Testing KW - code faults KW - software testing KW - scientific software KW - oracle problem KW - tolerance problem VL - 11 JA - Computing in Science and Engineering ER - | |||
Computational scientists often encounter code-testing challenges not typically faced by software engineers who develop testing techniques. Mutation sensitivity testing addresses these challenges, showing that a few well-designed tests can detect many code faults and that reducing error tolerances is often more effective than running additional tests.
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