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Issue No.02 - Feb. (vol.47)
ISSN: 0018-9162
TABLE OF CONTENTS
Front Cover (PDF)
pp. c1
Masthead (PDF)
pp. 1
pp. 2-3
David Forsyth , University of Illinois at Urbana-Champaign
pp. 6-7
Charles Severance , University of Michigan
pp. 8-10
Brian M. Gaff , McDermott Will & Emery, LLP
pp. 11-13
News Briefs (HTML)
pp. 16-20
Renee Bryce , University of North Texas
Rick Kuhn , National Institute of Standards and Technology
pp. 21-22
Midhat Ali , University of Camerino, Italy
Francesco De Angelis , University of Camerino, Italy
Daniele Fani , University of Camerino, Italy
Antonia Bertolino , CNR-ISTI, Pisa, Italy
Guglielmo De Angelis , CNR-ISTI, Pisa, Italy
Andrea Polini , CNR-ISTI, Pisa, Italy
pp. 23-29
Nuno Antunes , University of Coimbra, Portugal
Marco Vieira , University of Coimbra, Portugal
pp. 30-36
Cemal Yilmaz , Sabanci University, Istanbul, Turkey
Sandro Fouche , Towson University
Myra B. Cohen , University of Nebraska-Lincoln
Adam Porter , University of Maryland at College Park
Gulsen Demiroz , Sabanci University, Istanbul, Turkey
Ugur Koc , Sabanci University, Istanbul, Turkey
pp. 37-45
Jerry Gao , San Jose State University
Xiaoying Bai , Tsinghua University
Wei-Tek Tsai , Arizona State University
Tadahiro Uehara , Fujitsu Laboratories
pp. 46-55
Andreas Dahn , University of Rostock, Germany
Clemens H. Cap , University of Rostock, Germany
pp. 56-61
William J. Chimiak , Laboratory for Telecommunication Sciences
Samuel T. Patton , Laboratory for Telecommunication Sciences
Stephen Janansky , University of Delaware
pp. 62-69
Manfred Broy , Technical University of Munich, Germany
Albrecht Schmidt , University of Stuttgart, Germany
pp. 70-72
Hal Berghel , University of Nevada, Las Vegas
pp. 73-77
Apostol Vassilev , National Institute of Standards and Technology
Timothy A. Hall , National Institute of Standards and Technology
pp. 78-81
Rafael Capilla , Rey Juan Carlos University, Spain
Oscar Ortiz , Universidad Politécnica de Madrid, Spain
Mike Hinchey , Lero-the Irish Software Engineering Research Centre
pp. 85-87
pp. 92-93
pp. 94-103
David Alan Grier , George Washington University
pp. 104
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